Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
2019 / 7 Vol. 13; Iss. 4
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Estimating the Crystallographic Structure of AlGaN/GaN Heterostructure Buffer Layers Using Symmetric and Asymmetric X-ray Schemes
Lutzau, A. V., Temper, E. M., Enisherlova, K. L.Volume:
13
Language:
english
Journal:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
DOI:
10.1134/S1027451019040104
Date:
July, 2019
File:
PDF, 1.50 MB
english, 2019