[IEEE 2018 XIV International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk (2018.10.2-2018.10.6)] 2018 XIV International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Iterative Algorithm for Radius Stylus Compensation of Touch Sensor When Measured on CMMs of Complex Surfaces

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