[IEEE 2019 IEEE 23rd Workshop on Signal and Power Integrity...

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[IEEE 2019 IEEE 23rd Workshop on Signal and Power Integrity (SPI) - Chambéry, France (2019.6.18-2019.6.21)] 2019 IEEE 23rd Workshop on Signal and Power Integrity (SPI) - Study of the coupling of wide band Near Field Scan probe dedicated to the investigation of the radiated immunity of Printed Circuit Boards

DURIER, Andre, BEN DHIA, Sonia, DUBOIS, Tristan
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Year:
2019
Language:
english
DOI:
10.1109/sapiw.2019.8781661
File:
PDF, 1.83 MB
english, 2019
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