![](/img/cover-not-exists.png)
[IEEE 2019 IEEE 23rd Workshop on Signal and Power Integrity (SPI) - Chambéry, France (2019.6.18-2019.6.21)] 2019 IEEE 23rd Workshop on Signal and Power Integrity (SPI) - Study of the coupling of wide band Near Field Scan probe dedicated to the investigation of the radiated immunity of Printed Circuit Boards
DURIER, Andre, BEN DHIA, Sonia, DUBOIS, TristanYear:
2019
Language:
english
DOI:
10.1109/sapiw.2019.8781661
File:
PDF, 1.83 MB
english, 2019