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An Improved Low-Noise Processing Methodology Combined with PCL for Industry Inspection Based on Laser Line Scanner
Li, Jianxiong, Zhou, Qian, Li, Xinghui, Chen, Ruiming, Ni, KaiVolume:
19
Language:
english
Journal:
Sensors
DOI:
10.3390/s19153398
Date:
August, 2019
File:
PDF, 7.11 MB
english, 2019