Investigation of positive bias temperature instability for monolayer polycrystalline MoS2 field-effect transistors
Yang, GuanHua, Wang, JiaWei, Niu, JieBin, Chuai, XiChen, Lu, CongYan, Geng, Di, Lu, NianDuan, Li, Ling, Liu, MingVolume:
63
Language:
english
Journal:
Science China Physics, Mechanics & Astronomy
DOI:
10.1007/s11433-019-9400-2
Date:
January, 2020
File:
PDF, 451 KB
english, 2020