![](/img/cover-not-exists.png)
Impact of PZT gate-stack induced negative capacitance on analogue/RF figures-of-merits of electrostatically-doped ferroelectric Schottky-barrier tunnel FET
Singh, Sangeeta, Sinha, Ruchir, Kondekar, Pravin NeminathVolume:
13
Language:
english
Journal:
IET Circuits, Devices & Systems
DOI:
10.1049/iet-cds.2018.5276
Date:
July, 2019
File:
PDF, 3.65 MB
english, 2019