[IEEE 2019 China Semiconductor Technology International Conference (CSTIC) - Shanghai, China (2019.3.18-2019.3.19)] 2019 China Semiconductor Technology International Conference (CSTIC) - Quick Development of High Throughput RF Tests on HVM ATE
Wang, Ping., Frank, Goh., Du, Chuansheng., Huang, Chenpeng., Guo, Haixia., Yuan, Haocheng.Year:
2019
Language:
english
DOI:
10.1109/cstic.2019.8755679
File:
PDF, 1.05 MB
english, 2019