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[IEEE 2017 IEEE 7th Annual International Conference on CYBER Technology in Automation, Control, and Intelligent Systems (CYBER) - Honolulu, HI (2017.7.31-2017.8.4)] 2017 IEEE 7th Annual International Conference on CYBER Technology in Automation, Control, and Intelligent Systems (CYBER) - Automated Visual Inspection of Metallic Parts
Liu, Jiang, Li, Yaonan, Pan, Caijin, Chen, Heping, Xi, NingYear:
2017
Language:
english
DOI:
10.1109/cyber.2017.8446519
File:
PDF, 474 KB
english, 2017