The Simulation and Research of Etching Function Based on Scanning Electrochemical Microscopy
Wang, Xiaole, Han, Lianhuan, Geng, Yanquan, Zhao, Xuesen, Cao, Yongzhi, Hu, Zhenjiang, Zhan, Dongping, Yan, YongdaLanguage:
english
Journal:
Nanomanufacturing and Metrology
DOI:
10.1007/s41871-019-00047-1
Date:
August, 2019
File:
PDF, 2.03 MB
english, 2019