Simultaneous Topographical and Electrochemical Mapping...

Microscopy and Microanalysis 2019 / 08 Vol. 25; Iss. S2

Simultaneous Topographical and Electrochemical Mapping using Scanning Ion Conductance Microscopy – Scanning Electrochemical Microscopy (SICM-SECM)

Mendoza, Gabriela, Kim, Byong, Lee, Keibock
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Volume:
25
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927619004215
Date:
August, 2019
File:
PDF, 241 KB
english, 2019
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