![](/img/cover-not-exists.png)
[IEEE 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Florence, Italy (2019.3.25-2019.3.29)] 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Single-Event Double-Upset Self-Recoverable and Single-Event Transient Pulse Filterable Latch Design for Low Power Applications
Yan, Aibin, Hu, Yuanjie, Song, Jie, Wen, XiaoqingYear:
2019
Language:
english
DOI:
10.23919/DATE.2019.8714841
File:
PDF, 691 KB
english, 2019