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[IEEE 2019 42nd International Spring Seminar on Electronics Technology (ISSE) - Wroclaw, Poland (2019.5.15-2019.5.19)] 2019 42nd International Spring Seminar on Electronics Technology (ISSE) - Defects Investigation in Low-Temperature and Low-Pressure Sintered Silver Thermal Joints for Non-Metalized Semiconductors
Stojek, Krzysztof, Felba, Jan, Lizanets, Danylo, Kiliszkiewicz, Milena, Falat, Tomasz, Gorzka, KamilYear:
2019
Language:
english
DOI:
10.1109/ISSE.2019.8810178
File:
PDF, 1.74 MB
english, 2019