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[IEEE 2019 IEEE 3rd Information Technology, Networking, Electronic and Automation Control Conference (ITNEC) - Chengdu, China (2019.3.15-2019.3.17)] 2019 IEEE 3rd Information Technology, Networking, Electronic and Automation Control Conference (ITNEC) - A New Method for Satellite Control System Fault Pattern Recognition combining Multi-Classification SVM with Kernel Principal Component Analysis
Ke-Qiang, Xia, Meng, Xing, Jun, Wei, Bao-Jun, Lan, Zhuo, Chen, Gan-Hua, LiYear:
2019
DOI:
10.1109/itnec.2019.8729412
File:
PDF, 216 KB
2019