[IEEE 2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Cluj-Napoca, Romania (2019.4.24-2019.4.26)] 2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test

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