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[IEEE 2019 IEEE 69th Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2019.5.28-2019.5.31)] 2019 IEEE 69th Electronic Components and Technology Conference (ECTC) - Effects of Oven and Laser Sintering Parameters on the Electrical Resistance of IJP Nano-Silver Traces on Mesoporous PET Before and During Fatigue Cycling
Khinda, G.S., Kokash, M.Z., Alhendi, M., Yadav, M., Lombardi, J.P., Weerawarne, D.L., Poliks, Mark D., Borgesen, P., Stoffel, Nancy C.Year:
2019
Language:
english
DOI:
10.1109/ectc.2019.00299
File:
PDF, 1.89 MB
english, 2019