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[IEEE 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Kolkata, India (2018.11.24-2018.11.25)] 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Comparison of Electrical Characteristics of 28 Nm Bulk MOSFET and FDSOI MOSFET

Godara, Mehak, Madhu, Charu, Joshi, Garima
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Year:
2018
Language:
english
DOI:
10.1109/edkcon.2018.8770413
File:
PDF, 653 KB
english, 2018
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