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A low-cost concurrent TSV test architecture with lossless test output compression scheme
Lee, Young-woo, Lim, Hyunchan, Seo, Sungyoul, Cho, Keewon, Kang, Sungho, Yao, WeiVolume:
14
Language:
english
Journal:
PLOS ONE
DOI:
10.1371/journal.pone.0221043
Date:
August, 2019
File:
PDF, 4.85 MB
english, 2019