Sampling Bias and the Inspection Paradox

Sampling Bias and the Inspection Paradox

Stein, William E., Dattero, Ronald
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Volume:
58
Language:
english
Journal:
Mathematics Magazine
DOI:
10.1080/0025570x.1985.11977160
Date:
March, 1985
File:
PDF, 501 KB
english, 1985
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