![](/img/cover-not-exists.png)
[IEEE 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Kolkata, India (2018.11.24-2018.11.25)] 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Noise Characterization of InAs Based DG-HEMT Devices for RF Applications
Poornachandran, R, Mohankumar, N, Saravana Kumar, R, Baskaran, S, Kumutha, SYear:
2018
Language:
english
DOI:
10.1109/EDKCON.2018.8770495
File:
PDF, 476 KB
english, 2018