[IEEE 2018 IEEE Electron Devices Kolkata Conference...

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[IEEE 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Kolkata, India (2018.11.24-2018.11.25)] 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Noise Characterization of InAs Based DG-HEMT Devices for RF Applications

Poornachandran, R, Mohankumar, N, Saravana Kumar, R, Baskaran, S, Kumutha, S
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Year:
2018
Language:
english
DOI:
10.1109/EDKCON.2018.8770495
File:
PDF, 476 KB
english, 2018
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