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[IEEE 2018 International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2018.10.7-2018.10.11)] 2018 International Integrated Reliability Workshop (IIRW) - Reliability of High Speed Photodetector for Silicon Photonic Applications
Sy, F., Rafhay, Q., Besset, C., Beylier, G., Grosse, P., Roy, D., Broquin, J.-E.Year:
2018
Language:
english
DOI:
10.1109/IIRW.2018.8727087
File:
PDF, 156 KB
english, 2018