Validation of Thermal Resistance Extracted From...

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IEEE Transactions on Electron Devices 2019

Validation of Thermal Resistance Extracted From Measurements on Stripe Geometry SiGe HBTs

Balanethiram, Suresh, D'Esposito, Rosario, Fregonese, Sebastien, Chakravorty, Anjan, Zimmer, Thomas
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Year:
2019
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2019.2935012
File:
PDF, 877 KB
english, 2019
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