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[IEEE 2018 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition (iWEM) - Nagoya (2018.8.29-2018.8.31)] 2018 IEEE International Workshop on Electromagnetics:Applications and Student Innovation Competition (iWEM) - Effects of Selecting the Fitting Range for SAR Probe Calibration in Waveguide System
Ishii, Nozomu, Shimizu, Yuto, Nagaoka, Tomoaki, Watanabe, SoichiYear:
2018
Language:
english
DOI:
10.1109/iwem.2018.8536698
File:
PDF, 262 KB
english, 2018