Impact of Work-Function Modulation and Hetero Gate Engineering on Linearity and RF Performance of Charge Plasma TFET
Sahoo, Sasmita, Dash, Sidhartha, Mishra, Guru PrasadLanguage:
english
Journal:
International Journal of Nanoscience
DOI:
10.1142/s0219581x20400062
Date:
July, 2019
File:
PDF, 768 KB
english, 2019