[IEEE 2019 Symposium on VLSI Technology - Kyoto, Japan (2019.6.9-2019.6.14)] 2019 Symposium on VLSI Technology - Direct Partition Measurement of Parasitic Resistance Components in Advanced Transistor Architectures
Liu, Zuoguang, Wu, Heng, Zhang, Chen, Miao, Xin, Zhou, Huimei, Southwick, Richard, Yamashita, Tenko, Guo, DechaoYear:
2019
Language:
english
DOI:
10.23919/VLSIT.2019.8776477
File:
PDF, 1.28 MB
english, 2019