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[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Probing Write Error Rate and Random Telegraph Noise of MgO Based Magnetic Tunnel Juction Using a High Throughput Characterization System
Gao, Shifan, Chen, Bing, Xu, Nuo, Qu, Yiming, Zhao, YiYear:
2019
Language:
english
DOI:
10.1109/IRPS.2019.8720587
File:
PDF, 1.36 MB
english, 2019