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[IEEE 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC) - Suntec City, Singapore (2018.5.14-2018.5.18)] 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC) - A statistical equivalent circuit modelling based on measured and de-embedded S-parameters
Yang, De-Cao, Yao, Shi, Gao, Liang, Zhou, Jing, Xia, Nan, Gu, Zheng-Dong, Wei, Xing-ChangYear:
2018
Language:
english
DOI:
10.1109/ISEMC.2018.8394098
File:
PDF, 750 KB
english, 2018