Short–Circuit Failure Model of SiC MOSFET Including the Interface Trapped Charges
Zhou, Yuming, Liu, Hangzhi, Mu, Shilu, Chen, Zhaoquan, Wang, BingYear:
2019
Language:
english
Journal:
IEEE Journal of Emerging and Selected Topics in Power Electronics
DOI:
10.1109/JESTPE.2019.2939877
File:
PDF, 7.19 MB
english, 2019