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Short–Circuit Failure Model of SiC MOSFET Including the...

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Short–Circuit Failure Model of SiC MOSFET Including the Interface Trapped Charges

Zhou, Yuming, Liu, Hangzhi, Mu, Shilu, Chen, Zhaoquan, Wang, Bing
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Year:
2019
Language:
english
Journal:
IEEE Journal of Emerging and Selected Topics in Power Electronics
DOI:
10.1109/JESTPE.2019.2939877
File:
PDF, 7.19 MB
english, 2019
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