[IEEE 2019 20th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Erlagol (Altai Republic), Russia (2019.6.29-2019.7.3)] 2019 20th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Informativeness Assessment of the Thermal Pattern Features of the Face and Neck Region in the Tasks of Recognition of the Subject’s Changed State
Zhumazhanova, Samal S., Pasenchuk, Victor A., Lukin, Denis V., Vishnyakov, Denis. D., Belgorodtsev, Artem A.Year:
2019
Language:
english
DOI:
10.1109/EDM.2019.8823524
File:
PDF, 467 KB
english, 2019