[IEEE 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) - Kita-Kyushu City, Fukuoka, Japan (2019.3.18-2019.3.21)] 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) - A study on statistical parameter modeling of power MOSFET model by principal component analysis
Tsukamoto, Hiroki, Shintani, Michihiro, Sato, TakashiYear:
2019
Language:
english
DOI:
10.1109/ICMTS.2019.8730946
File:
PDF, 21.64 MB
english, 2019