[IEEE 2019 Electron Devices Technology and Manufacturing...

  • Main
  • [IEEE 2019 Electron Devices Technology...

[IEEE 2019 Electron Devices Technology and Manufacturing Conference (EDTM) - Singapore, Singapore (2019.3.12-2019.3.15)] 2019 Electron Devices Technology and Manufacturing Conference (EDTM) - Influence of post-deposition annealing on interface characteristics at Al 2 O 3 /n-GaN

Yuge, Kazuya, Nabatame, Toshihide, Irokawa, Yoshihiro, Ohi, Akihiko, Ikeda, Naoki, Uedono, Akira, Sang, Liwen, Koide, Yasuo, Ohishi, Tomoji
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2019
Language:
english
DOI:
10.1109/edtm.2019.8731166
File:
PDF, 271 KB
english, 2019
Conversion to is in progress
Conversion to is failed