[IEEE 2019 IEEE 69th Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2019.5.28-2019.5.31)] 2019 IEEE 69th Electronic Components and Technology Conference (ECTC) - A Viscoplastic-Based Fatigue Reliability Model for the Polyimide Dielectric Thin Film
Chang, Yu-Chen, Chiu, Tz-Cheng, Yang, Yu-Ting, Tseng, Yi-Hsiu, Chen, Xi-HongYear:
2019
Language:
english
DOI:
10.1109/ECTC.2019.00210
File:
PDF, 266 KB
english, 2019