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Effect of Annealing Environment on the Performance of Sol–Gel-Processed ZrO2 RRAM
Ha, Seunghyun, Lee, Hyunjae, Lee, Won-Yong, Jang, Bongho, Kwon, Hyuk-Jun, Kim, Kwangeun, Jang, JaewonVolume:
8
Language:
english
Journal:
Electronics
DOI:
10.3390/electronics8090947
Date:
August, 2019
File:
PDF, 2.93 MB
english, 2019