Direct measurement of hot-carrier generation in a semiconductor barrier heterostructure: Identification of the dominant mechanism for thermal droop
Myers, Daniel J., Gelžinytė, Kristina, Alhassan, Abdullah I., Martinelli, Lucio, Peretti, Jacques, Nakamura, Shuji, Weisbuch, Claude, Speck, James S.Volume:
100
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.100.125303
Date:
September, 2019
File:
PDF, 1.34 MB
english, 2019