[IEEE 2019 20th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Erlagol (Altai Republic), Russia (2019.6.29-2019.7.3)] 2019 20th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Application of a Hyper-Complex Impedance Model for Indirect Measurements of Materials Parameters of Functional Electronics
Artamonov, Dmitry V., Baranov, Victor A., Pecherskaya, Ekaterina A., Pushkareva, Anastasia V., Tsypin, Boris V., Fimin, Andrey V.Year:
2019
Language:
english
DOI:
10.1109/EDM.2019.8823442
File:
PDF, 734 KB
english, 2019