Stress-Lysis: A DNN-Integrated Edge Device for Stress Level Detection in the IoMT
Rachakonda, Laavanya, Mohanty, Saraju P., Kougianos, Elias, Sundaravadivel, PrabhaYear:
2019
Language:
english
Journal:
IEEE Transactions on Consumer Electronics
DOI:
10.1109/TCE.2019.2940472
File:
PDF, 5.75 MB
english, 2019