[IEEE 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Florence, Italy (2019.3.25-2019.3.29)] 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Accelerating Local Binary Pattern Networks with Software-Programmable FPGAs
Lin, Jeng-Hau, Lotfi, Atieh, Akhlaghi, Vahideh, Tu, Zhuowen, Gupta, Rajesh K.Year:
2019
Language:
english
DOI:
10.23919/DATE.2019.8714951
File:
PDF, 300 KB
english, 2019