Insights into different etching properties of continuous...

Insights into different etching properties of continuous wave and atomic layer etching processes for SiO 2 and Si 3 N 4 films using voxel-slab model

Kuboi, Nobuyuki, Tatsumi, Tetsuya, Komachi, Jun, Yamakawa, Shinya
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Volume:
37
Language:
english
Journal:
Journal of Vacuum Science & Technology A
DOI:
10.1116/1.5105384
Date:
September, 2019
File:
PDF, 3.74 MB
english, 2019
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