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Computer vision measurement system for standards calibration in XY plane with sub-micrometer accuracy
Costa, Pedro Bastos, Leta, Fabiana Rodrigues, de Oliveira Baldner, FelipeLanguage:
english
Journal:
The International Journal of Advanced Manufacturing Technology
DOI:
10.1007/s00170-019-04297-7
Date:
September, 2019
File:
PDF, 414 KB
english, 2019