![](/img/cover-not-exists.png)
Interface Defect Engineering for Improved Graphene-Oxide-Semiconductor Junction Photodetectors
Ruiz, Isaac, Beechem, Thomas E., Smith, Sean, Dickens, Peter, Paisley, Elizabeth, Shank, Joshua, Howell, Stephen W., Sarma, Raktim, Draper, Bruce L., Goldflam, MichaelLanguage:
english
Journal:
ACS Applied Nano Materials
DOI:
10.1021/acsanm.9b00978
Date:
September, 2019
File:
PDF, 2.15 MB
english, 2019