[Int. Test Conference 1995 IEEE International Test Conference (ITC) - Washington, DC, USA (21-25 Oct. 1995)] Proceedings of 1995 IEEE International Test Conference (ITC) - Dynamic test emulation for EDA-based mixed-signal test development automation
Jean Qincui Xia,, Austin, T., Khouzam, N.Year:
1995
Language:
english
DOI:
10.1109/test.1995.529907
File:
PDF, 940 KB
english, 1995