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[IEEE 2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Auckland, New Zealand (2019.5.20-2019.5.23)] 2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Superpixel-based HSI Classification via Semisupervised K-SVD and Multi-scale Sparse Representation
Lin, Lianlei, Chen, Cailu, Zhou, Zhuxu, Zhang, ShanshanYear:
2019
Language:
english
DOI:
10.1109/I2MTC.2019.8827111
File:
PDF, 242 KB
english, 2019