[IEEE 2019 IEEE International Conference on Electro Information Technology (EIT) - Brookings, SD, USA (2019.5.20-2019.5.22)] 2019 IEEE International Conference on Electro Information Technology (EIT) - Face Morphing Detection using Generative Adversarial Networks
Yu, Xinrui, Yang, Guojun, Saniie, JafarYear:
2019
Language:
english
DOI:
10.1109/EIT.2019.8834162
File:
PDF, 1.20 MB
english, 2019