[IEEE 2019 International Symposium on VLSI Technology,...

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[IEEE 2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu, Taiwan (2019.4.22-2019.4.25)] 2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Novel Vertically-Stacked Tensily-Strained Ge 0.85 Si 0.15 GAA n-Channels on a Si Channel with $\mathrm{SS}=76\mathrm{mV}/\mathrm{dec}, \mathrm{DIBL} =36\mathrm{mV}/\mathrm{V}$, and $\mathrm{I}_{\mathrm{on}}/\mathrm{I}_{\mathrm{off}}=1.2\mathrm{E}7$

Huang, Yu-Shiang, Lu, Fang-Liang, Ye, Hung-Yu, Tsou, Ya-Jui, Liu, Yi-Chun, Tu, Chien-Te, Liu, C. W.
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Year:
2019
Language:
english
DOI:
10.1109/VLSI-TSA.2019.8804698
File:
PDF, 936 KB
english, 2019
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