[IEEE 2019 China Semiconductor Technology International Conference (CSTIC) - Shanghai, China (2019.3.18-2019.3.19)] 2019 China Semiconductor Technology International Conference (CSTIC) - The Study of Metal Capacitor Transistor TDDB Failure Mechanism
Huang, Chong, Sun, Fangce, Zhang, Ming, Ji, AiyanYear:
2019
Language:
english
DOI:
10.1109/cstic.2019.8755649
File:
PDF, 954 KB
english, 2019