Mössbauer spectroscopic microscope study on diffusion and segregation of Fe impurities in mc-Si wafer
Yoshida, Yutaka, Watanabe, Tomio, Ino, Yuji, Kobayashi, Masashi, Takahashi, Isao, Usami, NoritakaVolume:
240
Language:
english
Journal:
Hyperfine Interactions
DOI:
10.1007/s10751-019-1651-2
Date:
December, 2019
File:
PDF, 4.22 MB
english, 2019