Trap induced negative differential conductance and...

Trap induced negative differential conductance and back-gated charge redistribution in AlGaN/GaN power devices

Binder, Andrew T., Yuan, Jiann-Shiun, Krishnan, Balakrishnan, Shea, Patrick M., Yeh, Wen-Kuan
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Volume:
102
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2019.113495
Date:
November, 2019
File:
PDF, 2.39 MB
english, 2019
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