![](/img/cover-not-exists.png)
Trap induced negative differential conductance and back-gated charge redistribution in AlGaN/GaN power devices
Binder, Andrew T., Yuan, Jiann-Shiun, Krishnan, Balakrishnan, Shea, Patrick M., Yeh, Wen-KuanVolume:
102
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2019.113495
Date:
November, 2019
File:
PDF, 2.39 MB
english, 2019