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[IEEE 2019 IEEE International Conference on Electro Information Technology (EIT) - Brookings, SD, USA (2019.5.20-2019.5.22)] 2019 IEEE International Conference on Electro Information Technology (EIT) - Reducing the Large Class Code Smell by Applying Design Patterns

Turkistani, Bayan, Liu, Yi
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Year:
2019
DOI:
10.1109/EIT.2019.8833851
File:
PDF, 350 KB
2019
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