Nanotribological characterization of...

Microsystem Technologies 2006 / 05 Vol. 12; Iss. 6

Nanotribological characterization of perfluoroalkylphosphonate self-assembled monolayers deposited on aluminum-coated silicon substrates

Bharat Bhushan, Michal Cichomski, Enamul Hoque, James A. DeRose, Patrik Hoffmann, Hans J. Mathieu
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Volume:
12
Language:
english
Pages:
9
DOI:
10.1007/s00542-006-0111-5
Date:
May, 2006
File:
PDF, 358 KB
english, 2006
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