Measurement of static and dynamic mechanical behavior of...

Microsystem Technologies 2011 / 04 Vol. 17; Iss. 4

Measurement of static and dynamic mechanical behavior of micro and nano-scale thin metal films: using micro-cantilever beam deflection

Ya-Chi Cheng, Chi-Jia Tong, Ming-Tzer Lin
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
17
Language:
english
Pages:
10
DOI:
10.1007/s00542-010-1202-x
Date:
April, 2011
File:
PDF, 657 KB
english, 2011
Conversion to is in progress
Conversion to is failed