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[IEEE 2019 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) - Boston, MA, USA (2019.6.2-2019.6.4)] 2019 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) - 22nm FD-SOI Technology with Back-biasing Capability Offers Excellent Performance for Enabling Efficient, Ultra-low Power Analog and RF/Millimeter-Wave Designs
Ong, S.N., Chan, L.H.K., Chew, K.W.J., Lim, C.K., Oo, W. L., Bellaouar, A., Zhang, C., Chow, W.H., Chen, T., Rassel, R., Wong, J.S., Wan, C.W.F., Kim, J., Seet, W.H., Harame, D.Year:
2019
Language:
english
DOI:
10.1109/RFIC.2019.8701768
File:
PDF, 1.14 MB
english, 2019